The Irtronµ (Irtron Micro) sample compartment microscopy system is designed to provide affordable analysis of microscopic samples with the high performance features of an external FT-IR microscope accessory.
The Irtronµ offers unprecedented convenience and ease of use, compatible with the JASCO FT/IR-4000 and 6000 series FT-IR instruments. The microscope accessory installs into the spectrometer sample compartment in seconds without optical alignment. The state-of-the-art optical design guarantees high throughput for highly sensitive measurements of samples approaching 20 microns. The Irtronµ can be operated with the integrated touch panel or via a PC using the Spectra Manager II software interface. The sample is observed with the integrated color CCD camera and a 5 inch TFT color LCD monitor. JASCO unique ATOS (Aperture Through Optical System) provides simultaneous viewing of the sample image and sampling location specified by the aperture.
Can be easily set into the sample compartment within seconds. No optical alignment is required before measurements.
Three measurement modes are available including: Transmittance, Reflectance, and ATR analysis.
DLATGS detector in FT-IR main instrument (standard)
MCT detector or Near IR optimized detector available (optional)
Optional sampling accessories for liquid and powder samples
Unique sample observation system allows complete view of sample, even during measurements.
Data acquisition and processing are performed by the Spectra Manager Software. Spectral data can be stored with a video capture of the sample view.
Kontakt: Mikael Alfredsson på Göteborgskontoret, 0709-119309
Mats Grapne Askfelt på Stockholms-kontoret, 0709-119301