New FT/IR-4X

Brochure

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JASCO is proud to offer unrivaled, class-leading performance in FTIR spectroscopy

JASCO has its roots in the Institute of Optics – Tokyo University of Education which developed Japan’s first infrared spectrophotometer, Model DS-101, in 1954. Since the establishment of the company in 1958, we have inherited the spirit of our predecessors in infrared spectrophotometry and have completed the FT/IR-4X as the culmination of our work. The size is only 386 (W) × 479 (D) mm, and we have also achieved a 30 % reduction in power consumption compared to conventional models.

Ideal for high resolution applications

The FT/IR-4X is research-grade in performance, functionality and expandability, and supports high resolution, high S/N, high sensitivity detectors, extending measurement wavenumber, microscopy with linear array detector, and rapid scan. The sample compartment is 200 mm wide, the same width as that of a high-end model, and can accommodate conventional accessories, including those from third parties. FT/IR-4X series offers reliable operation with industry-leading sensitivity and the most advanced technology available today. Their instrument features are as below;

● Stable Interferometer
● Excellent S/N Ratio
● High Sensitivity Detectors
● Wavenumber Extension
● Vibration-Free Optical Bench
● Moisture Protection
● Removal of Interferences from CO2 and H2O
● KnowItAll™ Informatics
● GxP/FDA 21 CFR Part 11 Compliant
● Microscope/IR Imaging

Product Specialist

Mats Grapne

"More than 30 years experience in the field of HPLC, Spectroscopy and other analytical equipments. Contact me if you have questions or need a quotation"

mats.grapne@kovalent.se

08-473 33 40

Features of FT/IR-4X

Superior performance

High S/N ratio

A 24-bit A/D converter, a low-noise electrical system, a high-intensity light source, a high-performance detector, and a high-throughput optical system all contribute to a high S/N of 35,000 : 1, enabling to perform small volume samples measurement and microscopy measurement with high sensitivity.

Coating on food packaging wrap film (ATR measurement)

PS film with φ0.5 mm size (Transmittance measurement)

High resolution

The maximum resolution is 0.4 cm-1 and the vibrational spectrum of gas can be measured. In addition, the automatic aperture wheel sets the optimal aperture size according to the resolution.

Transmittance spectrum of CH4 (methane) gas (using a 10 cm gas cell)

High wavenumber precision

Especially controlled diode laser (VCSEL) has realized a long-life time and contributes to the downsizing of the instrument. By oscillating the laser with high precision using the XLD method, the FT/lR-4X has a wavenumber precision of 0.0005 cm-1 which is equivalent to that of a He-Ne laser.

PS film data (overlaid 10 measurement spectra)

Outstanding flexibility

Optional detector

A variety of changeable detectors (MCT, InGaAs, etc.) can be added. Users can replace additional detectors.

RAS measurement of PMMA thin film with MCT detector

FT/IR-4X + MCT detector

Expandable measurement wavenumber range

In addition to the standard Mid IR, options are available to change to Near-Mid IR (11500 to 375 cm-1) and Mid-Far IR (6000 to 220 cm-1 or 6000 to 50 cm-1) by replacing the light source, beam splitter, window plate, and detector.

Measurement for PVDF in Mid-Far IR range

Rapid scan option

The FT/IR-4X is applicable for the rapid scan measurement at 80 spectra/sec. (16 cm-1 resolution), and the rapid reaction processes can be reliably obtained.

3D map

Peak change at 1427 cm-1

Reaction process of the UV-curing resin (using the MCT detector)

Large space sample compartment

Sample compartment width of 200 mm allows for use of large accessories. Smart Purge enables purging by simply setting compatible accessories.

FT/IR-4X + 12 m Gas cell

Compatible with microscope

Since FT/IR-4X is research-grade in performance, functionality and expandability, it is possible to combine with high performance IR microscope (IRT-5200) or multi-channel IR microscope (IRT-7200) for micro measurement.

FT/IR-4X + IRT-7200

Enhanced robustness and reliability

Corner-cube mirrors

Corner cube mirrors automatically correct for any light path deviation.

Mechanism of corner-cube mirror

Maintenance-free design

The overnight energization and periodic replacement of desiccant to protect the optical components are not required because of the proven robust sealed interferometer. The window plate of the interferometer is made of KRS-5, which has excellent humidity resistance. In addition, a long-life diode laser is used and a corner-cube mirror is used for the interferometer mirror.

The high sealability interferometer protects the humidity-sensitive optical elements. A built-in sensor constantly monitors temperature and humidity.

The diode laser is used as a sampling laser, and it has a high wavenumber precision of 0.0005 cm-1, which is equivalent to a He-Ne laser by the XLD method.

Self-diagnosis and validation

The self-diagnosis function checks the status of the FT/IR-4X at startup. If there is any problem, it will be detected immediately. The diagnosis results are automatically recorded, and it is possible to track the temporal change. Therefore, if there is a problem with the data, you can retrace and check.

In addition, FT/IR-4X is equipped with NIST traceable polystyrene film for easy validation. The status of the instrument can be checked daily and can be confirmed the reliability of analysis results.

Sophisticated software

FT/IR-X Series includes Spectra Manager™ Ver. 2.5 with integrated search software solution, KnowItAll Informatics and database JASCO edition.

Spectra Manager™ Ver. 2.5 is equipped with a navigation function that allows even those who are unfamiliar with IR analysis to perform measurements in the same way as experts. The parameters set by the navigation function enables starting measurement by simply opening them after registering in the method.

Navigation function

Measurement parameters suitable for your measurement purpose can be set by selecting menu according to the navigation.

Method function

Registering frequently used measurement parameters in the method, you can perform the measurement by just selecting the target method from the next time.

Advanced Spectra Search program (optional software)

Spectra search support program makes it possible for anyone to perform spectral analysis like an expertise operator. An epoch-making search program that uses machine learning techniques to perform classification without using a database. It has the function of classifying the spectrum of an unknown sample into 35 categories and the function of searching using a data library (approx. 600 data), and both two functions can be executed at the same time.

Optimized usability

40 % downsizing

The size is only 386 (W) × 479 (D) mm, and we have also achieved a 30 % reduction in power consumption compared to conventional models.

Comparison with conventional models (FT/IR-4000 series)

Dedicated ATR accessories for FT/IR-4X

Operability is significantly improved by the design that integrates with the main unit. Various samples including large size sample can be measured easily because the crystal surface is higher than the top surface of the main body. The iQX accessories automatically set the measurement parameters suitable for the ATR.

FT/IR-4X with ATR accessory

Remove the sample compartment lid and set ATR PRO 4X VIEW. This setting is very easy.

iQX automatically recognizes accessory and activates the measurement parameters used last time.

ATR PRO 4X VIEW allows you to check the image of the sample surface in close contact through the diamond crystal by the built-in high-resolution camera, and it is saved together with the measurement data.

ATR PRO 4X VIEW allows you to measure a large size sample without interfering with main unit because of its integrated design.

ATR PRO 4X VIEW has ZnSe, Ge and Diamond crystals that can be easily replaced.

When the crystal is replaced, the spectrum of the crystal will be recognized and a message will be displayed on the screen.