Designed for high-throughput labs that demand the best
The Agilent 5900 SVDV smart ICP system is an ICP optical emission spectrometer designed for high-throughput labs that demand the best. You can be sure of the right answer, in a shorter time, and at a lower cost per sample than any other ICP optical emission spectrometer.
● Synchronous Vertical Dual View (SVDV), allowing both the axial and radial views of the plasma to be captured in only one reading, enabling greater sample throughput at a lower cost and delivering accurate results in the quickest possible time
● Integrated Advanced Valve System (AVS), speeding up your analysis and drastically reducing your argon use, while still achieving the highest analytical precision
● IntelliQuant smart software, capturing data from the entire wavelength range allowing you to learn more about your samples, identifying spectral interferences and providing recommendations to ensure you get the right answers every time
● Early Maintenance Feedback (EMF), utilizing over 100 sensors that monitor and track instrument health, alerting the analyst when maintenance is needed, overcoming common reasons for service calls, and reducing expense and wasted time
● Neb Alert, continuously monitoring the nebulizer and alerting you when the nebulizer is leaking or needs cleaning, preventing wasted time and the cost of troubleshooting
● Smart tools like Fitted Background Correction (FBC), Fast Automated Curve-fitting Technique (FACT), Inter Element Correction (IEC), IntelliQuant and Intelligent Rinse, taking the guesswork out of method development and automating troubleshooting
● ICP Expert Pro Software, included as standard on the 5900 ICP-OES, giving you access to live export to Microsoft Excel, custom replicates, integrated prepFAST auto-dilutor operation, and other advanced software functionalities
How it works
Unique Dichroic Spectral Combiner technology
The Agilent 5900 Synchronous Vertical Dual View (SVDV) ICP-OES features the unique Dichroic Spectral Combiner (DSC). The DSC allows light emitted by trace-level elements to be captured from an axial view of the plasma. At the same time it captures light emitted by the typically abundant elements of Na and K from a radial view of the plasma. Capturing both views in one measurement delivers accurate results in the quickest time.
Using SVDV mode eliminates the need for a series of axial and radial measurements and the need for complicated method development.
Using a vertically-positioned torch means less deposits on the torch when measuring samples with high total dissolved solids. Less deposits means less cleaning, less replacement torches and less downtime.
Simultaneously using both the axial and radial views of the vertical torch, allows the measurement of trace-level elements at the same time as measuring Na and K, present at higher concentrations.
Available in the 5800 and 5900 ICP-OES instruments, the vertical torch orientation means robust measurements of tough samples
Minimize ownership costs
As the 5900 SVDV ICP-OES needs only a single measurement per sample it’s much faster than other ICP-OES instruments. Faster measurements mean less argon is consumed. Less argon consumption means reduced costs.
For example, measuring a water sample using the US EPA 200.7 method uses 20 L of argon on the 5900 instrument in SVDV mode. This compares to 27 L on the 5800 in Dual View mode and more than 40 L on competitor’s instruments.