The Jasco MSV-5000 series is a microscopic spectrophotometer system providing transmittance/reflectance measurements of a microscopic sample area with a wide wavelength range from ultraviolet to near infrared.
A broad range of applications including the collection of transmittance/reflectance spectra of a sample, measurement of the band gap and film thickness of semiconductors, evaluation of the optical characteristics of functional crystals and the color analysis of microscopic samples can be easily implemented using the MSV-5000 series
MSV-5100 Spectrophotometer is a dedicated UV-Vis microscope with a wavelength range of (200-900 nm).
MSV-5100 Spectrophotometer is a dedicated UV-Vis microscope with a wavelength range of (200-900 nm).
MSV-5200 Spectrophotometer includes a Peltier-cooled PbS detector and has a wavelength range of (200-2700 nm).
MSV-5300 Spectrophotometer incorporates an InGaAs detector to obtain optimized NIR measurements and has a wavelength range of (200-1600 nm).
The wide-band cassegrain objectives provide continuous transmittance/reflectance measurements for the entire spectral range desired, without the use of expensive, coated refractive objectives. An optional automated XYZ stage also offers mapping/imaging capability for larger samples.
CMOS camera. Options include binocular viewing, polarized observation and selected refractive objective lenses.
All models incorporate a user-selectable slitwidth for variable spectral resolution as well as selectable circular apertures and an adjustable rectangular aperture for sample area discrimination.
